Investigation of thickness-dependent stress in PbTiO3 thin films
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چکیده
منابع مشابه
Investigation of thickness-dependent stress in PbTiO3 thin films
X-ray diffraction (XRD) and Raman spectroscopy were used to investigate stress dependence on thickness in PbTiO3 (PTO) films grown by pulsed liquid injection Metalorganic Chemical Vapor Deposition on a LaAlO3 (001) substrate (LAO). Films on sapphire substrate (R-plane) were used as polycrystalline film reference. Epitaxial PTO films with a dominant c-domain structure are grown on LAO substrate ...
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ژورنال
عنوان ژورنال: Journal of Applied Physics
سال: 2008
ISSN: 0021-8979,1089-7550
DOI: 10.1063/1.2821728